Substrate for X-Ray Detector

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Substrate for X-Ray Detector

Material: Al-Si Alloys


Zuoyuan adopts rapid solidification and subsequent machining technology, offering a series of electronic packaging services,including R&D,production,subsequent machining and plating.
 
Product Details

Product Description

 »  Substrate for X-Ray detector

 

Selectable Silicon Aluminum(Si/Al) Alloys 

 »  AlSi70(Si-30%Al controlled expansion alloy)

 

Beneficial Properties

 »  High thermal conductivity;
 »  Low CTE match to CMOS components;
 »  Possess higher stiffness compared with other commonly used materials;
 »  Competitive cost;
 »  Dimensional stability,flatness.

 

A lSi Alloys Performance Parameters

 
Content
wt%
Density
g/cm³
CTE
25℃
ppm/℃
Thermal 
Conductivity

25℃ W/mK
Tensile 
Strength

MPa
Yield 
Strength

MPa
Poisson's 
Ratio
Elongation
%
Elastic  
Modulus   
GPa 
Al-20%Si 2.40 6 110 125 125 -- -- 132
Al-27%Si 2.6 17 175 170 130 0.29 3.8 91
Al-30%Si 2.43 7.5 120 138 138 0.25 <1 131
Si-40%Al 2.46 9 125 181 181 0.27 <1 121
Si-42%Al 2.55 13.5 143 200 187 0.29 1 105
Si-50%Al 2.5 11.5 140 200 210 0.28 <1 108
 
Grade Density
g/cm³
CTE
ppm/℃
Thermal 
Conductivity

W/mK
Tensile 
Strength

MPa
Yield 
Strength

MPa
Poisson's 
Ratio
Elongation
%
Elastic  
Modulus   
GPa 
ZY-4047 2.66 21.6 193 208 129 0.33 18 70
ZY-6061 2.7 22.6 210 312 270 0.33 12.5 69
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